The Hahn-Schickard Institute directors, Prof Oliver Amft, Dr Karl-Peter Fritz and Prof Alfons Dehé, warmly welcomed the guests and introduced them to the latest research and development topics. They not only presented Hahn-Schickard's mission and vision, but also gave a detailed insight into current technological advances and projects.
During the visit, the SIA delegates were able to view a variety of exhibits and demonstrators. These impressively illustrated Hahn-Schickard's latest developments and innovations, including advanced sensor technologies and IoT solutions for a wide range of applications. The practical demonstration of these technologies gave the guests an in-depth insight into Hahn-Schickard's work and expertise.
Networking was a particular focus of the visit. The members of the SIA delegation took the opportunity to engage in intensive dialogue with the experts from Hahn-Schickard and to explore potential collaborations. This meeting represents an important step towards deepening international cooperation between Germany and China.
"It was a pleasure to welcome the company representatives from the China Sensor and IoT Industry Association. The international exchange is invaluable for exploring the needs of the industry and mirroring them with our range of services," emphasised Prof. Alfons Dehé, Institute Director at Hahn-Schickard.
The visit of the SIA delegation to Hahn-Schickard symbolises a further significant step in the international cooperation between German and Chinese institutions and companies in the field of sensor technology and the Internet of Things.